Optimization of 25 µm gold wire lead bonding process parameters based on orthogonal test
نویسندگان
چکیده
Abstract The gold wire lead bonding process is a key technology to realize the electrical connection between chip and external control circuit be completed. This paper introduces basic concept of analyzes parameters affecting quality bonding, mainly including ultrasonic power, time, pressure. orthogonal test method used investigate 25 μm wire. optimal combination A 3 B 2 C determined, i.e., power value 90 mW, time 20 ms, pressure 40 gf, which improves reliability process.
منابع مشابه
Active Test Chips for in Situ Wire Bonding Process Characterisation
The real-time monitoring of an industrial ball bonding process is reported using a new type of test chips with custom-made integrated sensors (microsensors). These sensors were fabricated using a commercial double-metal CMOS process [1]. Two types of integrated monitors are reported, a temperature [2] and an ultrasound shear force sensor [3]. The temperature sensor uses the thermoelectric prope...
متن کاملDigital Control of Bonding Force for Gold Wire Bonding Machine
In order to digitally control the bonding force of a wire bonder precisely, this paper uses a DC solenoid as a force source, and by controlling the solenoid’s current, which causes the electromagnetic force, we can control the bonding force that capillary applies. The bonding force control system in this paper is composed of PC (Personal Computer) and hypogyny MCU (Micro Controller Unit), which...
متن کاملThermosonic Gold Wire Bonding to Palladium Finishes on Laminate Substrates
As the laminate substrate industry moves from Hot Air Solder Level (HASL) finishes, alternate plating finishes are being proposed such as immersion gold/electroless nickel, electroless palladium and electroless silver. This paper presents results of an evaluation of the thermosonic gold ball wire bondability of electroless palladium. Two palladium thicknesses, with and without a nickel underlay...
متن کاملThe Quality Test of Wire Bonding
The reliability of the IC chip during performance of its function in any application is very much dependant on the quality of the wire bond interconnection. If the quality of the wire bond interconnection is poor and not consistent, it has a significant impact on the reliability and dependability of the device. The quality of a wire bond is determined by the strength of the interfaces between t...
متن کاملOF PACKAGE I / O LEAD ELECTRICAL PARASITICS FOR DIFFERENT PACKAGES Electrical Parameters Wire - bonding Package Type
This paper is concerned with the analysis and optimization of the ground bounce in digital CMOS circuits. First, an analytical method for calculating the ground bounce is presented. The proposed method relies on accurate models of the short-channel MOS device and the chip-package interface parasitics. Next the effect of ground bounce on the propagation delay and the optimum tapering factor of a...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Journal of physics
سال: 2023
ISSN: ['0022-3700', '1747-3721', '0368-3508', '1747-3713']
DOI: https://doi.org/10.1088/1742-6596/2524/1/012032